Contents of JSA Vol.14 No.2 (2007) 94 - 185


Thought to My Study


Identification of Background in CMA

Technical Report

Assessment of Peak Detection Algorithm Proposed by ISO/TC201/SC3 for X-ray Photoelectron Spectroscopy
?Activity Report of VAMAS/TWA2/A9 Project

      “Evaluation of Procedures for Automated Peak Detection in X-ray Photoelectron Spectra”?
The Secondary Electron Emission Characteristics of Carbon Materials (in Japanese)
Ion Beam Alignment Procedures using a Faraday Cup or a Silicon Dioxide Film on Silicon Substrate with Auger Electron Microscope

Serial Lecture (in Japanese)

Introduction to Electron Optics for the Study of Energy Analyzing System (10)

Extended Abstract

Getting More from XPS Imaging: Multivariate Analysis for Spectromicroscopy

SASJ Saloon(in Japanese)

Participating Report on “12th European Conference on Applications of Surface and Interface Analysis (ECASIA’07)”


Comment on “Identification of Background in CMA” [J. Surf. Anal. 14, 95 (2007)]
Response to “Comment on ‘Identification of background in CMA’” [J. Surf. Anal. 14, 169 (2007)]
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