Preface
SerendipityN. Sanada・・・・55
Technical Report
Development and Technical Issues on 2D-Carrier Profiling of Silicon Devices by Scanning Spreading Resistance Microscopy (SSRM) with 1 nm spatial resolutionLi Zhang・・・・56
Review
Silicene grown on silver surfaceRyuichi Arafune, Chun-Liang Lin, and Noriaki Takagi・・・・63
Brief introduction about crystal-structure database and crystallographic data format, CIF 2. Crystallograhic Information File (CIF)
Yoshitaka Matsushita・・・・71
Serial Lecture
The Usage of Common Data Processing System Versio 10 - (6) Simulation -K. Yoshihara・・・・82
SASJ Saloon
Activity Reports of ToF-SIMS Working Groups at the 43rd Meeting of SASJT. Ishikawa and ToF-SIMS WG・・・・87
Activity Reports of XPS Working Groups at the 43rd Meeting of SASJ
XPS WG・・・・89
Activity Reports of Depth Profiling Working Groups at the 43rd Meeting of SASJ
Depth Profiling WG・・・・92
Instructions to Authors
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JSA Contribution Form
・・・・・・・・・・・・101
Copyright Transfer Agreement
・・・・・・・・・・・・103
Regular Subscription Order Form
・・・・・・・・・・・・106
Back Number Order Form
・・・・・・・・・・・・108
Postscript
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