PrefaceTowards practical use of ISO
ReviewThe Usage of COMPRO12 (part 1)
K. Yoshihara・・・・2Progress of MassBank towards the Global Standard of Mass Spectral Database
Technical ReportAutomatic Estimation of XPS spectrum Background Using an Active Shirley Method Improved by Auto-Tuning Function of Initial End Points
Yugo Nishizawa, Ryo Matsumoto, Noriyuki Kataoka, Hiromi Tanaka,Hideki Yoshikawa, Shigeo Tanuma, and Kazuhiro Yoshihara・・・・36Study of Surface Cleaning Conditions by the Ar-GCIB for XPS Analysis
Ako Miisho, and Masayuki Inaba・・・・47
Extended AbstractStructural Analysis in the Surface of Nitride Semiconductor by Grazing Incidence X-ray Diffraction
Tsukasa Motoya, Kenichiro Kurahashi, and Yasushi Uehara・・・・56
Q&AQuestions on "J. Surf. Anal. 21, 2 (2014)"
Mineharu Suzuki・・・・61Answers to the "Questions on J. Surf. Anal. 21, 2 (2014)"
Hiroshi Okumura, and Kazuhisa Mine・・・・62
SASJ SaloonReport on Question and Answer at JASIS Conference 2017 "Practical surface analysis - knowledge of surface analysis for beginners"
Takaharu Nagatomi・・・・64Reports on the 49 th Meeting of Surface Analysis Society of Japans
・・・・67Activity Reports of 4th Meeting of Young SASJ Members
Young SASJ Members Mainly in Their 20's and 30's・・・・72
Instructions to Authors
JSA Contribution Form
Copyright Transfer Agreement
Regular Subscription Order Form
Back Number Order Form