Contents of JSA Vol.24 No.2 (2017) 104 - 173

Proceedings of the 7th International Symposium on Practical Surface Analysis (PSA-16)
October 16-21, 2016, Hotel ICC, Daejeon, Korea


Surface Analysis as a Key Metrology for Advanced Industries

Opening Remarks

Opening Remarks

Prenary Lecture

Novel Applications of Inelastic Background XPS Analysis: 3D Imaging and HAXPES (Invited Review)

Theory and Simulation

Modeling of Electron Transport in the Surface Region of Solids: Metrology of Quantitative Analysis by Electron Spectroscopies (Invited Review)

Standardization and pre-standardization

Lateral Resolution of Imaging Surface-Analytical Instruments as SIMS, AES and XPS: Application of the BAM-L200 Certi-fied Reference Material and Related ISO Standards (Invited Paper)

Applications I (Metal, Semiconductor, etc)

Low-Voltage Scanning Electron Microscopy as a Tool for Surface Imaging and Analysis of Practical Materials (Invited Paper) Evaluation of Potential Distribution in Channel Region of Amorphous InGaZnO Thin Film Transistor by Bias Applied Hard X-ray Photoelectron Spectroscopy (Paper)

Applications II (Green Material, etc)

Multimodal and in-situ Chemical Imaging of Critical Surfaces and Interfaces in Advanced Batteries (Invited Review)

Applications III (Low Dimensional Materials)

Microscopic Analysis of Graphene and Carbon Nanotube Growth (Invited Review)

Novel techniques and instrumentations

Angular Distribution of Secondary Ions under FIB-shave-off Condition -Toward Development of Three-Dimensional Secondary Ion Image System- (Paper) Analysis of the Shape of Cross Sections Developed under Shave-off Condition Sputtering (Paper) Use of High Energy Collision Induced Dissociation (HE-CID) in TOF-SIMS for Unambiguous Peak Identification and Imaging (Peer-Reviewed Abstract)

Member of the Committee of PSA-16