Contents of JSA Vol.5 No.2 (1999) 193 - 363
Proceedings of PSA 98 (1998) Part 2

Charge Referencing of XPS Spectra from Fluorocarbon Polymer Films using Fluorine as an Internal Standard
Optimization of an Electrometer on Noise and Linearity
Comparison of XPS Spectra of Inorganic Materials with Various Kinds of Pre-treatment Methods
Interfacial Reaction of Cu/Polyimide using XPS
Chemical Analysis of AES, XPS and XRD data using Self Organising Maps
A New Resonace Photoionization SNMS Instrument for Submicron Microarea Analsysis
Surface Characterization of Polystyrene Treated with Plasma Source Ion Implantation
Surface Damage of Organic Materials during XPS Analysis (1)
Surface Damage of Organic Materials during XPS Analysis (2)
Evaluation of Glass Fiber Reinforced Plastics by XPS and TOF-SIMS
Evaluation of Resin by XPS and TOF-SIMS
Degradation of Polymers (PVC, PTFE, M-F) during X-ray Photoelectron Spectroscopy (XPS-ESCA) Analysi
AES in Metallurgy: Materials Design Based on Anisotropy of Grain Boundary Segregation
XPS and AES Study of Au/GaN and Au/Cr/GaN Contacts
GD-OES Characterization of Copper Enrichment at the Interface between Oxide Layer and Matrix in Iron-Copper Alloys
Effects of Phosphorus in Steel on Galvannealing Behavior of Galvanized Steel
The Effect of X-ray Scanning on Intensity and Binding Energy of Photoelectron Peak and the Line Scanning Analysis of an Etched Crater
X-ray Photoelectron Spectroscopy Study of Ba1-xAxBiOy Superconductors
AES, REELS Study of Fe/Ni Alloys
Fe-Ni Alloys Studied by XPS
GD-OES/XPS Study of the Surface of Silicon Steel Sheets Annealed in Atmosphere with Various H2O/H2 Ratios
Relative Yields of Secondary Ions Sputtered from Fe, FeO, Fe3O4 and Fe2O3 by Cs+ and O2+
GDOS/XRD Study of Alloying Processes in Zinc Coated Steel Sheet by Annealing at High Temperatures
RHEED and AES Study of Metal-Insulator-Metal Thin Film Systems: Nb-Al2O3-Nb
Pb-valence Studied by XPS and Chemical Analysis
Phosphorus Grain Boundary Segregation in Polycrystalline Low Alloy Steels
Surface Analysis for Glass Coating Technology
XPS Analysis of Zeolitic Materials
Surface Analysis of Cubic SiC Thin Films Prepared by High Vacuum Chemical Vapor Deposition Using 1, 3-Disilabutane
Chemical State Analysis of Bi2Sr2CaCu2Oy Single Crystals Heated in Air
Core Level Binding Energy Shift of Pd Supported on Al2O3
Substrate Dependence of Secondary Ion Intensities from Langmuir-Blodgett Films Investigated by TOF-SIMS
The Influence of Electron Radiation on ZnS-SiO2 films
Ag/TiO2 Composite Ultra-fine Particle Studied with FE-SAM
Application of SIMS to Examination of Coastal Organisms
Electrode Formation and Surface Analysis of Bi-based Superconducting Ceramics
Characterization of Nanostructures by Electron Spectroscopies
In-situ Deposition of Metal Nanoparticles on Si (110) Thin Film Surfaces in UHV-FE-TEM
Application of a UHV-MBE-TEM System on the Deposition and HRTEM Study of Indium Nanoparticles
The Possibility of Chemical State Analysis for Silicide Using XPS
Compositions of Cross Sections Created with a Gallium Focused Ion Beam
Composition Change and Surface Morphology Induced by Ion Sputtering for III-V Semiconductors using AES