Contents of JSA Vol.6 No.1 (1999) 1 - 130


To Continue the Collaboration

Lecture: Practical Surface Analysis

The Basis of Electron Spectroscopy for Surface
Practical Aspects of Charge Compensation in X-ray Photoelectron Spectroscopy
Simulation of time-dependent Charging of Insulators under Electron Beam Irradiation (in Japanese)


Quantification of dimer (Al2+, Ga2+) SIMS Depth profiles of a GaAs/AlAs Multilayer Structure using the MRI-model
Evaluation of SIMS depth resolution with Delta Multi-layer Reference Materials
Study of Electron Beam Irradiation Damage Factor for SiO2 Films
Core Level and Auger Line Shifts in CoPt Alloys
Studies of Polystyrenes Using Time-of-Flight Secondary Ion Mass Spectrometry
Surface Damage of Organic Materials during XPS Analysis (3)
A Method of Evaluating Sample Damage in XPS using Nitrocellulose as a Standard for Organic Materials
Surface Characterization of Organic Electroluminescent Thin Film Materials

Technical Reports

The "Spectral Data Processor" for Windows 3.1, 95, 98, NT or OS/2 and The "SpecMaster Pro" Digital Database System of 35,000 XPS Spectra
Reference Materials Used in My Laboratory
Introduction of COMPRO Version 6 (in Japanese)

Topical Reports

Chemical Analysis of XPS (X-ray Photoelectron Spectroscopy) Data using Self-Organising Maps
Charge Neutraliser for Magnetic Lens System (in Japanese)
Chrage Compensation Studies for Insulators in AES by Low Energy Ion Beam Irradiation

Salon in SASJ

Discussions on Internet (in Japanese)

Bulletin Board

Looking Back to a Great Experience
Report from PSA- PSA-98 International Symposium on Practical Surface Analysis(in Japanese)
Report from 2-nd Korea-Japan International Symposium on Surface Analysis "Practical Analysis and Standardization" (in Japanese)

Minutes of Working groups

8-th and 9-th meeting of Database Committee
12th meeting of Organic Materials Group
12th meeting of Inorganic Materials Group
12th meeting of Metal Materials Group
12th meeting of Electronic Materials Group
Journal of Surface Analysis: Guide for Authors
Journal of Surface Analysis: Cumulative Author Index/Contents of Volume 4