Preface
Is APS nostalgia for my youthful days ? (in Japanese)Y. Fukuda・・・・131
Lecture: Practical Surface Analysis
COMPRO Version 6 Getting Started (1) (in Japanese)K. Yoshihara・・・・132
Papers
Characterization of Micro-Corrosion on Magnetic Recording Disks by ToF-SIMS and AASY. Abe, M. Shibayama, J. Sasahara, and J. Kozu・・・・148
Influence of Tilt Angle on Peak profile in AES Measurement of Insulator
Y. Ohtsuka and Inorganic Materials Group of SASJ・・・・155
Synthesis and Structure of Polymer/Metal Interfaces: a Convergence of Views between Theory and Experiment
C. Bureau and J. Delhalle・・・・159
Accurate Density Functional Calculation of Core XPS Spectra: Towards an Evidencing of Intermolecular Effects at Real Interfaces via XPS ?
C. Bureau, S. Kranias and D. P. Chong・・・・171
C 1s CEBEs of Hydrocarbons on Elemental Oxides. I. MO Caluculations using CH4 Model Molecules
T. Otsuka, C. Bureau, K. Endo, M. Suhara, and D. P. Chong・・・・181
Spectral Analysis of XPS of Diamond and Graphite by MO Calculations using Model Molecles
K. Endo, T. Morohashi, T. Otsuka, S. Koizumi, M. Suhara, and D. P. Chong・・・・186
Technical Reports
Improvement and Control Method of the Sample Stage on the Scanning Probe Microscope (in Japanese)M. Kimura・・・・191
Quantitative Electron Microprobe Analysis of Porous Specimens (in Japanese)
M. Nishio and S. Tanuma・・・・197
Determination of Oxygen Content in the Oxide Layer on a High-Purity Copper Specimen by XPS (in Japanese)
A. Aso・・・・204
A Comparison with a Factor Analysis and a Non-negative Least Square curve fitting method for Auger depth profiles (in Japanese)
T. Kitada, T. Harada, and S. Tanuma・・・・209
Topical Reports
Characterization of Siliconoxide Thin Films by X-ray Photoelectron Spectroscopy(in Japanese)H. Shibata, S. Kimura, and H. Takato・・・・223
Thickness Evaluation of Thin Silicon Dioxide (in Japanese)
A. Kurokawa・・・・226
A Proposal for the Sputter Etching Rate Database (in Japanese)
M. Inoue・・・・228
Proposal of Sputtered Depth Measurement using Metallic Mesh (in Japanese)
K. Mogi and M. Suzuki・・・・230
Activity Report from Material Ggroups in SASJ (in Japanese)
・・・・・・・・・・・・231
Salon in SASJ
Report from IUVSTA Workshop "XPS: from Physics to Data" (in Japanese)J. Kawai・・・・235
Book Review
Advanced in Quantum Chemistry Vol. 29 - electronic structure of clusters - Editor-in-chief: P. O. Lowdin, Editor: J. R. Sabin, M. C. Zerner, E. Brandas, L. Kover, J, Kawai, and H. Adachi, Academic Press, 1997, ISBN: 0-12-034829-2M. Yoshitake・・・・236
Minutes of Working groups
10-th meeting of Database Committee・・・・・・・・・・・・238
13th meeting of Organic Materials Group
・・・・・・・・・・・・239
13th meeting of Metal Materials Group
・・・・・・・・・・・・240
13th meeting of Electronic Materials Group
・・・・・・・・・・・・241
Spectral database: Guide for Submission to SASJ
・・・・・・・・・・・・247
Journal of Surface Analysis: Guide for Authors
・・・・・・・・・・・・250