Contents of JSA Vol.7 No.3 (2000) 299 - 355


Hopes on Surface Analysis in Next Millennium (in Japanese)


X-Ray Photoelectron Spectra of Manganese(III), Iron(III), Nickel(II), Copper(II) and Zinc(II) Schiff Base Complexes
Use of Low Energy Ions for Removal of Damaged Layer of Cross-sectioned Specimen Prepared by Focused Ion Beam

Technical Reports

Design of a Sample Holder and Pinhole Mask Maker for Surface Analysis of Powders (in Japanese)

Salon in SASJ

Report from Skill-up Seminar on Surface Analysis (in Japanese)
Report on International Symposium, The 3rd Korea-Japan International Symposium on Surface Analysis (in Japanese)