Preface
Activities on Surface Analysis in KoreaHee Jae Kang・・・・1
Proceedings of the International Symposium on
New Trends and Possibilities of Surface Analysis
- Towards the Analysis of Nano-structured Materials -
AES and XPS analysis of nanowear and thin films
J.T. Grant・・・・4
Possible Application of Appearance Potential Spectroscopy (APS) to Studies of Empty Electronic States, Short Range Ordering, and Work Function for Nano-Material Surfaces
Y.Fukuda, M.Kuroda, S.Mochizuki, I.Yatsuzuka, N.Sanada and Y.Suzuki・・・・11
Absolute Electron Energy Analyzer
Keisuke Goto・・・・18
Determination of the differential surface excitation parameter from experimental REELS data
Yung-Fu Chen・・・・27
Information on local electronic sturucture at surfaces and interfaces from analysis and interpretation of electron spectra
L. Kövér・・・・33
Surface Analysis of Compound Semiconductor Nano-structures by AFM and STM
T.Fukui and J.Motohisa・・・・39
Lectures
Present status of the international standards -ISO and VAMAS- (in Japanese)Kazuhiro Yoshihara・・・・41
The Present Status and the Trend of ISO TC201 on Surface Chemical Analysis
-Terminology, General Procedure, Data Management and Treatment- (in Japanese)
Yoichiro Furukawa・・・・45
-Depth Profiling- (in Japanese)
Kazuo Kajiwara・・・・54
-Auger electrons spectroscopy and X-ray photoelectron spectroscopy- (in Japanese)
Shigeo Tanuma・・・・60
-Secondary Ion Mass Spectrometry- (in Japanese)
Shunichi Hayashi・・・・64
-Background and Present Status of International Standardizaion of Glow DischargeSpectrometry- (in Japanese)
Shigeru Suzuki and Kazutoshi Kakita・・・・67
Topical Reports
Calibration of energy scale for AES in ISO standardsSatoshi Hashimoto and Shigeo Tanuma・・・・69
Auger Quantitative Analysis with Relative Sensitivity Factors
Shigeo Tanuma and Takashi Kimura・・・・72
Activity in SASJ toward Standardization
Mineharu Suzuki・・・・73
Papers
Quantitative Evaluation of Electron Irradiation Damage on SiO2/Si with AES (in Japanese)T.Kimura, S.Tanuma, M.Inoue, M.Suzuki, S.Hashimoto and K.Miura・・・・75
Development of Unique Specimen Holder for LEED-AES Study at High Temperatures
S.Iida, T.Tsujita, T.Nagatomi and Y.Takai・・・・81
Enhanced surface sensitivity in TOF-SIM Sunder well optimized Low Primary Beam Energy (in Japanese)
T.Hoshi, M.Tozu and M.Kudo・・・・88
Possibilities of TOF-SIMS Approach for Biometrics (in Japanese)
M.Tozu, T.Hoshi and M.Kudo・・・・99
New Technology
X-ray Photoelectron Emission Microscopy (XPEEM) (in Japanese)N.Sanada and M.Taguchi・・・・109
Technical Notes
Spectral analysis with the spreadsheet software (in Japanese)Kazuhiko Dohmae・・・・114
Salon in SASJ
Report from Skill-up Seminar of Electron Spectroscopy, 2001 (in Japanese)Skill-up Seminar Executive Committee・・・・116
Report from The 2nd International Symposium on Practical Surface Analysis, PSA-01 (in Japanese)
PSA-01 Executive Committee・・・・123
Errata
・・・・・・・・・・・・124
Minute of the 4th SERD Project Meetings
・・・・・・・・・・・・125
Member list of SASJ executive committee
・・・・・・・・・・・・126
SASJ member ID application form
・・・・・・・・・・・・128
Spectral Database: Guide for Submission to SASJ
・・・・・・・・・・・・131
Journal of Surface Analysis: Guide for Authors
・・・・・・・・・・・・136
Journal of Surface Analysis 投稿票
・・・・・・・・・・・・140