Contents of JSA Vol.9 No.3 (2002) 273 - 486
Proceedings of PSA-01 (International Symposium on Practical Surface Analysis, November 19-21, 2001, Nara, Japan)


K. Yoshihara

Keynote Lecture

Quantitative AES and XPS: Tests of Theory Using AES and XPS Databases with REELS Background Subtraction

Data Analysis and Processing

Determination of Inelastic Mean Free Path of High Energy Electrons from Shape Analysis of K-Auger and K-conversion Spectra Emitted from Thin Films
Experimental Determination of Electron Inelastic Mean Free Paths in Silver, Gold, Copper and Silicon from Electron Elastic Peak Intensity Ratios
Automatic Background Estimation of Spectra
Optimization of XPS Inelastic Background using Tougaard’s Formula - Recent Progress
Restoration of Loss Function in Very Difficult Case - From Poor Resolution Spectrum
Determination of the Depth Scale in Sputter Depth Profiling (The Sputtered Depth in Depth Profiling)
Analysis of Auger Depth Profiles by Logistic Function
Application of Self-Organising Maps (SOM) to Chemical Spectra Analysis


The NIST Electron Effective-Attenuation-Length Database

New Instrumentations and Techniques

Fermi Level Movements at the Transition Metal/GaN Interface
Laboratory XPS Imaging: Improved Procedures and Data Analysis
Grazing Incidence X-Ray Photoelectron Spectroscopy: A Method to Study Gate Dielectric Films on Si
In-situ Work Function Measurement of Molecular Beam Epitaxy Film Surface Using RHEED-Beam Excited Secondary Electron Peaks
Reference Auger Electron Spectra with Work Function Corrected
Influence of Ion Beam Position Shift on the Depth Profiling in AES
X-Ray Wave Guide and its Possible Application to Surface Analysis; X-Ray Traveling Waves
Surface Spectroscopy Utilizing Field Electron Emission from Thermal-field Treated Tips in STM
Charging Effects in Gold Nanoclusters Grown on Octanedithiol Self-assembled Monolayers Observed by Scanning Tunneling Microscopy and X-ray Photoelectron Spectroscopy
Management of Extreme Trace Analysis of Metal on Silicon Wafer Surfaces
The Development of the Angle Resolved XPS Equipment at SPring-8 BL15XU


Practical Characterization of Surface and Interface Phenomena in Iron and Steel
Nickel Enrichment at the Interface between Oxide Layer and Matrix in Iron-NickelAlloys
Redistribution Behavior of Trace Elements during Internal Oxidation of an Fe-6mol% Si Alloy at 1123 K
Surface Segregation of Substrate Al in the Cr/Al/Al System
Practical Aspects of Charging Phenomena in XPS as Demonstrated in Oxidized-Al Films on Al and Al Alloys
Surface Analysis of Impact Compressed Cu-Ni Multilayer
Boron and Oxygen Redistribution during Silicidation Process of Titanium-Silicon System
Evaluation of Solder Composition by Surface Analysis
Cross-sectional analysis of the Interface between Sn-Ag-Cu solder alloy and Substrate by using angle lapping Method
XPS Analysis and Solder Wettability of Sn-Cu and Sn-Pb Platings Accelerated by Various Methods

Electronic Materials

Study of Capacitor Material for Advanced Memory Devices using Surface Analysis
Interdiffusion at Ge/Si Interfaces Studied with AES Depth Profiling
Chemical Shift at Interface for Silicides
Atomic Scale Interface Analysis with MEIS for Nano-Electronics Technology
A Practical Procedure for Surface Protection of a Bulk Specimen in the Air

Inorganic Materials

Surface Analysis of Oxide Glass Surfaces : the Relationship between Atomic Charges and XPS Chemical Shifts
Effects of Charging and Crystallinity on Sputter-Etching Rate of Al2O3 Single Crystal
Changes in the Chemical State and Composition of the Surface of Iron Oxides due to Argon Ion Sputtering
Alternation of Ti 2p XPS Spectrum for TiO2 by Ar Ion Bombardment

Organic Materials

Photoelectron Spectroscopy Study of the Electronic Structures of Al/MgF2/tris-(8-hydroxyquinoline) aluminum Interfaces
Theoretical X-ray Photoelectron and Auger Electron Spectra of Polymers by Density Functional Theory Approaches Using Model Molecules
Surface Damage of PVC Polymers during XPS Analysis
Analysis of XPS and AES of Carbon Allotrope (Diamond, Graphite, C60) by DFT Calculations using the Model Molecules

Author Index