Contents of JSA Vol.9 No.4 (2002) 487 - 574


Shall we get up our courage to remove a paving stone?


Bias Voltage Dependence of "Work Function" at Nanometer-Scale by Scanning Tunneling Microscope (in Japanese)
Development of Evaluation Method of Sample Damage of Organic Material Caused by X-rays Irradiation on XPS. Results of Round Robin Test (in Japanese)
C 1s CEBSs of Hydrocarbons on Elemental Oxides. U. The Adsorption Type of CH4 on the MgO Cluster
Sputter Etching Rate Ratio of Si to SiO2 using Mesh-Replica Method


A Round Robin Test on XPS Transmission Function

Proposal for TASSA Report

Guide to some methods for detecting peaks in X-ray photoelectron spectroscopy and Auger electron spectroscopy

Invitation to Participate in a New Round Robin Test
SASJ member ID application form
Application from for Surface Analyst Accredited
Spectral Data Submission Guide
Spectral Data Submission Form
Instructions to Authors
JSA Contribution Form
Copyright transfer agreement
Order Forms