| 1.Symposium (02/02/17) : Keyaki (TRANOMON Pastoral 8F) |
| Title:Possibilities of Surface and Interface Analysis for Thin Films and
Coating |
| |
Title |
Speaker |
| AM session : 10:00-12:05 |
| |
Opening remark |
|
| 10:05-11:00 |
Progress in Quantitative Sputter Depth Profiling using the MRI-model |
Prof. S. Hofmann
(Max-Planck-Institut) |
| 11:10-12:05 |
Damage profiling of low energy ion sputter Si surface |
Prof. H. J. Kang
(Chungbuk National Univ.) |
| PM session 13:30-17:30 |
| 13:30-14:25 |
Surface analysis of III-V compound semiconductor and their sulfur-treated
surfaces - Surface atomic composition, structures, and electronic states
- |
Prof. Y. Fukuda
(Shizuoka Univ.) |
| 14:25-15:20 |
SIMS analysis Sallow dopant |
Dr. S. Miwa (SONY) |
| 15:35-16:30 |
TEM Characterization of Galvannealed Steel |
Dr. T. Kato
(Japan Fine Ceramics Center) |
| 16:30-17:25 |
Chemical state analysis using EPMA |
Dr. M. Motoyama
(Hyogo Prefectual Institute of Technology) |
| 18:00- :Banquet, Shirakaba(TRANOMON Pastoral 8F) |
